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Proceedings Paper

Series of laser scanning techniques as a nondestructive tool for testing solar cells and batteries
Author(s): Sergiy V. Litvinenko; Leonid M. Ilchenko; Sergiy O. Kolenov; Eugene M. Smirnov; Valery A. Skryshevsky
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Paper Abstract

We have designed a series of original techniques able to obtain non-destructively the 2D distribution of the several important parameters. Laser scanning of dynamically loaded solar cell has been shown to give a distribution of the dark current density since this value determines the local heat power and the reflectivity of the cell surface. An additional positive voltage bias at local laser irradiation and typical working conditions applies to the solar cell due to the concentration of current lines within the illuminated spot and due to the voltage drop depending of the local emitter resistivity. Quantitative comparison of the resistance sensitive photocurrent distribution and such distribution in the resistance independent conditions gives an information about local resistivity. The analysis of LBIC signal obtained from the whole battery at the different bias voltage and illumination conditions has shown to investigate the contribution of each cell to the total efficiency and the energy losses, switching to the output contacts of the battery only. This approach makes it possible to monitor the cell characteristics in encapsulated modules directly in loading conditions and without their destruction.

Paper Details

Date Published: 28 May 1999
PDF: 9 pages
Proc. SPIE 3707, Laser Radar Technology and Applications IV, (28 May 1999); doi: 10.1117/12.351376
Show Author Affiliations
Sergiy V. Litvinenko, Kiev Taras Shevchenko Univ. (Ukraine)
Leonid M. Ilchenko, Kiev Taras Shevchenko Univ. (Ukraine)
Sergiy O. Kolenov, Kiev Taras Shevchenko Univ. (Ukraine)
Eugene M. Smirnov, Kiev Taras Shevchenko Univ. (Ukraine)
Valery A. Skryshevsky, Kiev Taras Shevchenko Univ. (Ukraine)


Published in SPIE Proceedings Vol. 3707:
Laser Radar Technology and Applications IV
Gary W. Kamerman; Christian Werner, Editor(s)

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