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Proceedings Paper

In-situ x-ray microscopy of phase and composition distributions in metal alloys during solidification
Author(s): William F. Kaukler; Peter A. Curreri
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Paper Abstract

This research applies a state of the art x-ray transmission microscope, to image the solidification of metallic or semiconductor alloys in real-time. By employing a hard x-ray source with sub-micron dimensions, resolutions of up to 2 micrometers can be obtained with magnifications of over 800 X. Specimen growth conditions were optimized and the best imaging technologies applied to maintain x-ray image resolution, contrast and sensitivity. In addition, a special furnace design is required to permit controlled growth conditions and still offer maximum resolution and image contrast. We have successfully imaged in real-time: interfacial morphologies, phase growth, coalescence, incorporation of phases into the growing interface, and the solute boundary layer in the liquid at the solid-liquid interface. We have also measured true local growth rates and can evaluate segregation structures in the solid; a form of in situ metallography. Composition gradients within the specimen cause variations in absorption of the flux such that the final image represents a spatial integration of composition. During this study, the growth of secondary phase fibers and lamellae form eutectic and monotectic alloys have been imaged during solidification, in real-time, for the first time in bulk metal alloys.

Paper Details

Date Published: 6 July 1999
PDF: 12 pages
Proc. SPIE 3792, Materials Research in Low Gravity II, (6 July 1999); doi: 10.1117/12.351290
Show Author Affiliations
William F. Kaukler, Univ. of Alabama in Huntsville (United States)
Peter A. Curreri, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 3792:
Materials Research in Low Gravity II
Narayanan Ramachandran, Editor(s)

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