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Proceedings Paper

Optical properties of chiral thin films fabricated by glancing angle deposition
Author(s): Jeremy C. Sit; Scott R. Kennedy; Dick J. Broer; Michael J. Brett
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Paper Abstract

Glancing angle deposition (GLAD), developed recently by Robbie and Brett, is an advanced technique of thin film deposition that can produce porous thin films with columnar microstructural features controllable on a ten nanometer scale. GLAD combines highly oblique angle deposition with computer controlled substrate motion to allow engineering of thin film microstructure for a diverse range of applications. Of particular promise for optical applications are chiral thin film morphologies, including films fabricated by GLAD possessing helical microstructure. Previous optical characterization has demonstrated rotation of the plane of polarization in these films. In this work, circularly polarized spectroscopic transmission measurements on helical GLAD films have shown selective reflection/scattering of the circular polarization which matches the handedness of the film, with the helical pitch controlling the peak wavelength. The geometric properties of films fabricated with GLAD, such as film density, helical rise angle, and helical radius can be controlled independently and easily allowing optical properties to be tailored as desired.

Paper Details

Date Published: 30 June 1999
PDF: 6 pages
Proc. SPIE 3790, Engineered Nanostructural Films and Materials, (30 June 1999); doi: 10.1117/12.351250
Show Author Affiliations
Jeremy C. Sit, Univ. of Alberta (Canada)
Scott R. Kennedy, Univ. of Alberta (Canada)
Dick J. Broer, Philips Research Labs. (Netherlands)
Michael J. Brett, Univ. of Alberta (Canada)

Published in SPIE Proceedings Vol. 3790:
Engineered Nanostructural Films and Materials
Akhlesh Lakhtakia; Russell F. Messier, Editor(s)

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