Share Email Print
cover

Proceedings Paper

Near-field scanning optical microscopy imaging: theory, simulation, and experiment
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Near-field scanning optical microscopy (NSOM) is begin studied to achieve optical resolution much better than the diffraction limit. Improved resolution is realized when the sample is in the near field of the probe. Strong near-field coupling between sample and probe complicates image analysis. Experiments with well characterized tips and simple samples are needed to produce basic NSOM images. Detailed modeling able to reproduce imags and identify essential features in image formation is required. We analyze experimental NSOM transmission images of nanochannel glass arrays and of Au nanoparticles obtained in illumination mode. We use several approaches, including the discrete dipole method and the transfer matrix method, to simulate these images. Experimental and simulated images are compared to identify the contributions of tip-field structure, sample scattering, and the collection process to the images and to provide a clear interpretation of these NSOM images.

Paper Details

Date Published: 23 June 1999
PDF: 9 pages
Proc. SPIE 3609, Optical Pulse and Beam Propagation, (23 June 1999); doi: 10.1117/12.351044
Show Author Affiliations
Garnett W. Bryant, National Institute of Standards and Technology (United States)
Ansheng Liu, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3609:
Optical Pulse and Beam Propagation
Yehuda B. Band, Editor(s)

© SPIE. Terms of Use
Back to Top