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Proceedings Paper

Mechanical impedance measurements for improved cost-effective process monitoring
Author(s): Caroline R. Clopet; Deborah A. Pullen; Rodney Alan Badcock; Brian Ralph; Gerard Franklyn Fernando; Steve W. Mahon
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Paper Abstract

The aerospace industry has seen a considerably growth in composite usage over the past ten years, especially with the development of cost effective manufacturing techniques such as Resin Transfer Molding and Resin Infusion under Flexible Tooling. The relatively high cost of raw material and conservative processing schedules has limited their growth further in non-aerospace technologies. In-situ process monitoring has been explored for some time as a means to improving the cost efficiency of manufacturing with dielectric spectroscopy and optical fiber sensors being the two primary techniques developed to date. A new emerging technique is discussed here making use of piezoelectric wafers with the ability to sense not only aspects of resin flow but also to detect the change in properties of the resin as it cures. Experimental investigations to date have shown a correlation between mechanical impedance measurements and the mechanical properties of cured epoxy systems with potential for full process monitoring.

Paper Details

Date Published: 9 June 1999
PDF: 12 pages
Proc. SPIE 3668, Smart Structures and Materials 1999: Smart Structures and Integrated Systems, (9 June 1999); doi: 10.1117/12.350742
Show Author Affiliations
Caroline R. Clopet, Defence Evaluation and Research Agency Farnborough and Brunel Univ. (United Kingdom)
Deborah A. Pullen, Defence Evaluation and Research Agency Farnborough (United Kingdom)
Rodney Alan Badcock, Defence Evaluation and Research Agency Farnborough (United Kingdom)
Brian Ralph, Brunel Univ. (United Kingdom)
Gerard Franklyn Fernando, Cranfield Univ./Royal Military College of Science (United Kingdom)
Steve W. Mahon, Defence Evaluation and Research Agency Farnborough (United Kingdom)


Published in SPIE Proceedings Vol. 3668:
Smart Structures and Materials 1999: Smart Structures and Integrated Systems
Norman M. Wereley, Editor(s)

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