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Proceedings Paper

Pipette SNOM/AFM probe applicable to any wavelength and combination with confocal microscope
Author(s): Hiroshi Muramatsu; Norio Chiba; Katsunori Homma; Noritaka Yamamoto; Akira Egawa
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Paper Abstract

A novel pipette SNOM/AFM probe has been developed for its simple fabrication and applicability to wide wavelength range. The pipette probe is simply fabricated by a successive process of pulling, bending with a CO2 laser, making a hole and coating with a metal layer. The hole is made on the tube at the back side of the tip for applying a light. The pipette probe is mounted on the SNOM/AFM system which includes a confocal microscope. The light is introduced to the hole directly by focusing from a confocal microscope or through an optical fiber. The probe provided clear topographic and optical images for a sample of a patterned chromium layer on a glass substrate and fluorescence beads. A confocal images was also obtained in a wide area of the same samples.

Paper Details

Date Published: 17 June 1999
PDF: 5 pages
Proc. SPIE 3607, Scanning and Force Microscopies for Biomedical Applications, (17 June 1999); doi: 10.1117/12.350634
Show Author Affiliations
Hiroshi Muramatsu, Seiko Instruments Inc. (Japan)
Norio Chiba, Seiko Instruments Inc. (Japan)
Katsunori Homma, Seiko Instruments Inc. (Japan)
Noritaka Yamamoto, Seiko Instruments Inc. (Japan)
Akira Egawa, Seiko Instruments Inc. (Japan)


Published in SPIE Proceedings Vol. 3607:
Scanning and Force Microscopies for Biomedical Applications
Eiichi Tamiya; Shuming Nie, Editor(s)

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