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Proceedings Paper

Vapor bubble formation during erbium:YAG laser vitrectomy
Author(s): Michael Mrochen; Christof Donitzky; Peter Riedel; Micaela Wenig; Max Reindl; Theo Seiler
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Paper Abstract

Background: The formation of evaporation bubbles and pressure waves during Erbium:YAG laser vitrectomy might cause intraocular damages. Methods: In water, the formation of the evaporation bubbles was observed by high-speed photography. The output energy of the quartz tip ranges from 5 to 50 mJ and the laser pulse duration from 50 μsec to 300 μsec. The dynamic of the evaporation bubbles were investigated for different diameters, various angles and radii of the quartz fiber tip. Furthermore, the spread out of the evaporation bubbles was observed for various geometries of the microsurgery probe. The induced stress waves were measured with a PVDF-hydrophone. Results: The evaporation bubble size increases semi-logarithmic with the pulse energy and reduces with the increase of the pulse duration. The diameter of the tip has no significant influence in the vapor bubble size. The expansion of the vapor bubble can be controlled by the geometry of the tip. The spread out of the vapor bubble can reduced by a slit geometry of the aspiration hole. The maximum pressure amplitude as found to be < 2 MPa. Conclusions: The evolution of evaporation bubbles and the induced pressure amplitudes from the microsurgery probe can be minimized for Erbium:YAG laser vitrectomy.

Paper Details

Date Published: 18 June 1999
PDF: 11 pages
Proc. SPIE 3591, Ophthalmic Technologies IX, (18 June 1999); doi: 10.1117/12.350578
Show Author Affiliations
Michael Mrochen, Univ. of Dresden (Switzerland)
Christof Donitzky, WaveLight Laser Technologie GmbH (Germany)
Peter Riedel, Univ. of Dresden (Germany)
Micaela Wenig, Univ. of Dresden (Germany)
Max Reindl, WaveLight Laser Technologie GmbH (Germany)
Theo Seiler, Univ. Dresden (Switzerland)


Published in SPIE Proceedings Vol. 3591:
Ophthalmic Technologies IX
Bruce E. Stuck; Pascal O. Rol; Michael Belkin; Karen Margaret Joos; Fabrice Manns; Bruce E. Stuck; Michael Belkin, Editor(s)

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