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Proceedings Paper

Ocular dispersion
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Paper Abstract

Spectrally resolved white-light interferometry (SRWLI) was used to measure the wavelength dependence of refractive index (i.e., dispersion) for various ocular components. The accuracy of the technique was assessed by measurement of fused silica and water, the refractive indices of which have been measured at several different wavelengths. The dispersion of bovine and rabbit aqueous and vitreous humor was measured from 400 to 1100 nm. Also, the dispersion was measured from 400 to 700 nm for aqueous and vitreous humor extracted from goat and rhesus monkey eyes. For the humors, the dispersion did not deviate significantly from water. In an additional experiment, the dispersion of aqueous and vitreous humor that had aged up to a month was compared to freshly harvested material. No difference was found between the fresh and aged media. An unsuccessful attempt was also made to use the technique for dispersion measurement of bovine cornea and lens. Future refinement may allow measurement of the dispersion of cornea and lens across the entire visible and near-infrared wavelength band. The principles of white- light interferometry including image analysis, measurement accuracy, and limitations of the technique, are discussed. In addition, alternate techniques and previous measurements of ocular dispersion are reviewed.

Paper Details

Date Published: 18 June 1999
PDF: 11 pages
Proc. SPIE 3591, Ophthalmic Technologies IX, (18 June 1999); doi: 10.1117/12.350572
Show Author Affiliations
Daniel X. Hammer, Univ. of Texas at Austin (United States)
Gary D. Noojin, The Analytical Sciences Corp. (United States)
Robert J. Thomas, Air Force Research Lab. (United States)
David J. Stolarski, The Analytical Sciences Corp. (United States)
Benjamin A. Rockwell, Air Force Research Lab. (United States)
Ashley J. Welch, Univ. of Texas at Austin (United States)


Published in SPIE Proceedings Vol. 3591:
Ophthalmic Technologies IX
Bruce E. Stuck; Pascal O. Rol; Michael Belkin; Karen Margaret Joos; Fabrice Manns; Bruce E. Stuck; Michael Belkin, Editor(s)

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