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Proceedings Paper

Picosecond characterization of low-frequency fluctuations in edge-emitting semiconductor lasers with optical feedback
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Paper Abstract

Moderate feedback levels in edge emitting semiconductor lasers may cause different unstable regimes of operation. One of them is known as the regime of Low Frequency Fluctuations. We performed an experimental study of this regime on a picosecond time scale using a single-shot streak camera. Our measurements show the fine temporal structure of the laser emission in this regime and reveal the multimode nature of laser operation.

Paper Details

Date Published: 22 June 1999
PDF: 7 pages
Proc. SPIE 3516, 23rd International Congress on High-Speed Photography and Photonics, (22 June 1999); doi: 10.1117/12.350442
Show Author Affiliations
G. Vaschenko, Colorado State Univ. (United States)
Carmen S. Menoni, Colorado State Univ. (United States)
Jorge J. G. Rocca, Colorado State Univ. (United States)
Massimo Giudici, Institut Non Lineare de Nice (France)
Jorge R. Tredicce, Institut Non Lineare de Nice (France)
Salvador Balle, Univ. de les Illes Balears (Spain)

Published in SPIE Proceedings Vol. 3516:
23rd International Congress on High-Speed Photography and Photonics
Valentina P. Degtyareva; Mikhail A. Monastyrski; Mikhail Ya. Schelev; Alexander V. Smirnov, Editor(s)

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