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Proceedings Paper

3-D moire contouring with modified CCD-camera
Author(s): M. Seib; Heinrich A. Hoefler
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Paper Abstract

A new type of moire reference grid on the surface of a CCD-chip is presented. In surface contouring an improvement of the resolution by a factor of 4 is achieved. The modification steps to generate the new reference grid are simple. Any further modification of the internal image size or the electronic design of the CCD-camera is not necessary.

Paper Details

Date Published: 1 October 1990
PDF: 11 pages
Proc. SPIE 1375, ICALEO '89: Optical Sensing and Measurement, (1 October 1990); doi: 10.1117/12.35029
Show Author Affiliations
M. Seib, Fraunhofer-Institut fuer Physikalishce Messtechnik (Germany)
Heinrich A. Hoefler, Fraunhofer-Institut fuer Physikalische Messtechnik (Germany)


Published in SPIE Proceedings Vol. 1375:
ICALEO '89: Optical Sensing and Measurement
Kevin G. Harding, Editor(s)

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