Share Email Print

Proceedings Paper

3-D inspection of large objects by moire profilometry
Author(s): Joel H. Blatt; Jeffery A. Hooker; Robert V. Belfatto; Eddie H. Young
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Details

Date Published: 1 October 1990
PDF: 5 pages
Proc. SPIE 1375, ICALEO '89: Optical Sensing and Measurement, (1 October 1990); doi: 10.1117/12.35026
Show Author Affiliations
Joel H. Blatt, Florida Institute of Technology (United States)
Jeffery A. Hooker, Florida Institute of Technology (United States)
Robert V. Belfatto, Newport Electro-Optic Systems, (United States)
Eddie H. Young, Newport Electro-Optic Systems, (United States)

Published in SPIE Proceedings Vol. 1375:
ICALEO '89: Optical Sensing and Measurement

© SPIE. Terms of Use
Back to Top