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Proceedings Paper

Simultaneous strain and temperature measurement using a Brillouin-scattering-based distributed sensor
Author(s): Jeffrey Smith; Anthony W. Brown; Michael D. DeMerchant; Xiaoyi Bao
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Paper Abstract

Recent improvements to Brillouin scattering based distributed sensors have reduced both the spatial and strain resolutions to the point where they are acceptable for many smart structures applications. This type of optical fiber sensor can measure both strain and temperature as both parameters produce a change in the optical fiber's Brillouin frequency. Since both measurands have the same observed effect it is impossible to determine which measurand is responsible for the shift in frequency. This problem must be overcome for these sensors to be suitable for many smart structures applications. Techniques have recently been developed for Brillouin scattering based distributed sensor systems to separate strain and temperature information. However, these methods are limited theoretically to spatial resolutions approaching 5 - 10 meters. This paper reports on a new technique that was used at a shorter spatial resolution. The Brillouin loss spectrum peak power was determined as a function of strain and temperature at a spatial resolution of 3.5 meters. By combining this information with the conventional Brillouin frequency measurement, strain and temperature were successfully differentiated.

Paper Details

Date Published: 31 May 1999
PDF: 8 pages
Proc. SPIE 3670, Smart Structures and Materials 1999: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials, (31 May 1999); doi: 10.1117/12.349749
Show Author Affiliations
Jeffrey Smith, Univ. of New Brunswick (Canada)
Anthony W. Brown, Univ. of New Brunswick (Canada)
Michael D. DeMerchant, Univ. of New Brunswick (Canada)
Xiaoyi Bao, Univ. of New Brunswick (Canada)


Published in SPIE Proceedings Vol. 3670:
Smart Structures and Materials 1999: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials
Richard O. Claus; William B. Spillman, Editor(s)

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