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Proceedings Paper

Measurement of the quadratic electro-optic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer
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Paper Abstract

A simple procedure is developed for the measurement of the differential quadratic electro-optic coefficient, R33, by two-beam polarization (TBP) interferometry. It is shown that a TBP interferometer can be used for measuring the Kerr coefficient of a thin film with a strong Fabry-Perot effect. The measured values of the differential effective Kerr coefficient, R33 of lead zirconate titanate 52/48 thin film lie inside the interval between -0.5 * 10-18 m2/V2 and +1.7 * 10-18 m2/V2 for the external DC field from -160 kV/cm to 160 kV/cm, in agreement with the known data. The correlation between differential electro-optic coefficients and field-induced birefringence is discussed.

Paper Details

Date Published: 31 May 1999
PDF: 12 pages
Proc. SPIE 3670, Smart Structures and Materials 1999: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials, (31 May 1999); doi: 10.1117/12.349722
Show Author Affiliations
Vasilii V. Spirin, CICESE (United States)
Mikhail G. Shlyagin, CICESE (United States)
Serguei V. Miridonov, CICESE (Mexico)
Kwangsoo No, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 3670:
Smart Structures and Materials 1999: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials
Richard O. Claus; William B. Spillman, Editor(s)

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