Share Email Print
cover

Proceedings Paper

Signal and noise analysis using transmission line model for larger-area flat-panel x-ray imaging sensors
Author(s): Zhong Shou Huang; Giovanni DeCrescenzo; John A. Rowlands
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The objective of this paper is to analyze quantitatively and systematically the major electronic noise source and provide design guidelines to improve signal to noise ratio in large area flat panel x-ray imaging systems. A transmission line model combined with a thin-film transistor model and transfer functions of charge-amplifier and correlated-double sampling is employed to simulate the electronic noises arising from the external amplifiers, data lines, gate lines and pixels. Simulation results using simple discrete RC models are presented for comparison. The noise analysis method and noise formula presented will provide guidelines to achieve the goal of optimization in imaging performance and quantum noise limited operation of the detector.

Paper Details

Date Published: 28 May 1999
PDF: 14 pages
Proc. SPIE 3659, Medical Imaging 1999: Physics of Medical Imaging, (28 May 1999); doi: 10.1117/12.349546
Show Author Affiliations
Zhong Shou Huang, Sunnybrook and Women's College Health Science Ctr./Univ. of Toronto (United States)
Giovanni DeCrescenzo, Sunnybrook and Women's College Health Science Ctr./Univ. of Toronto (Canada)
John A. Rowlands, Sunnybrook and Women's College Health Science Ctr./Univ. of Toronto (Canada)


Published in SPIE Proceedings Vol. 3659:
Medical Imaging 1999: Physics of Medical Imaging
John M. Boone; James T. Dobbins, Editor(s)

© SPIE. Terms of Use
Back to Top