Share Email Print
cover

Proceedings Paper

X-ray imaging using lead iodide as a semiconductor detector
Author(s): Robert A. Street; Jeffrey T. Rahn; Steve E. Ready; Kanai S. Shah; Paul R. Bennett; Yuriy N. Dmitriyev; Ping Mei; Jeng-Ping Lu; Raj B. Apte; Jackson Ho; Koenraad Van Schuylenbergh; Francesco Lemmi; James B. Boyce; Per Nylen
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The x-ray imaging performance is reported using polycrystalline lead iodide as a thick semiconductor detector on an active matrix flat panel array. We have developed a test image sensor with 100 micron pixel size in a 512 X 512 format, using amorphous silicon TFTs for matrix addressing. The new 14 bit electronic system allows radiographic and fluoroscopic x-ray imaging. PbI2 has larger x-ray absorption and higher charge generation efficiency than selenium, and has the potential for higher sensitivity imaging. The films are deposited by vacuum sublimation and have been grown thicker than 100 micrometer. Measurements of the carrier transport and charge collection, together with modeling studies show how the x-ray sensitivity depends on the material properties. Imaging measurements find excellent spatial resolution and confirm models of the x-ray sensitivity. Both radiographic and fluoroscopic imaging are demonstrated. While good overall imaging is obtained, the dark leakage current and image lag need further improvement.

Paper Details

Date Published: 28 May 1999
PDF: 12 pages
Proc. SPIE 3659, Medical Imaging 1999: Physics of Medical Imaging, (28 May 1999); doi: 10.1117/12.349504
Show Author Affiliations
Robert A. Street, Xerox Palo Alto Research Ctr. (United States)
Jeffrey T. Rahn, Xerox Palo Alto Research Ctr. (United States)
Steve E. Ready, Xerox Palo Alto Research Ctr. (United States)
Kanai S. Shah, Radiation Monitoring Devices, Inc. (United States)
Paul R. Bennett, Radiation Monitoring Devices, Inc. (United States)
Yuriy N. Dmitriyev, Radiation Monitoring Devices, Inc. (United States)
Ping Mei, Xerox Palo Alto Research Ctr. (United States)
Jeng-Ping Lu, Xerox Palo Alto Research Ctr. (United States)
Raj B. Apte, Xerox Palo Alto Research Ctr. (United States)
Jackson Ho, Xerox Palo Alto Research Ctr. (United States)
Koenraad Van Schuylenbergh, Xerox Palo Alto Research Ctr. (United States)
Francesco Lemmi, Xerox Palo Alto Research Ctr. (United States)
James B. Boyce, Xerox Palo Alto Research Ctr. (United States)
Per Nylen, Univ. of Stockholm (United States)


Published in SPIE Proceedings Vol. 3659:
Medical Imaging 1999: Physics of Medical Imaging
John M. Boone; James T. Dobbins, Editor(s)

© SPIE. Terms of Use
Back to Top