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Proceedings Paper

Ultrafast dynamics of confined and localized excitons in low-dimensional semiconductors
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Paper Abstract

Coherent optical spectroscopy in the form of nonlinear transient four-wave mixing (TFWM) and linear resonant Rayleigh scattering (RRS) has been applied to investigate the exciton dynamics of low-dimensional semiconductor heterostructures. The dephasing times of excitons are determined from the decay of the spectrally resolved non- linear signal as a function of the delay between the incident pulses in a two-beam TFWM experiment, and from the real time analysis of single speckles in RRS experiments (pure dephasing). From the density- and temperature- dependence of the dephasing times the exciton-exciton and the exciton-phonon interactions are determined. The degree of coherence of the secondary emission is determined from the speckle analysis.

Paper Details

Date Published: 24 May 1999
PDF: 9 pages
Proc. SPIE 3624, Ultrafast Phenomena in Semiconductors III, (24 May 1999); doi: 10.1117/12.349310
Show Author Affiliations
Jorn M. Hvam, Technical Univ. of Denmark (Denmark)
Wolfgang Langbein, Technical Univ. of Denmark (Denmark)
Paola Borri, Technical Univ. of Denmark (Denmark)


Published in SPIE Proceedings Vol. 3624:
Ultrafast Phenomena in Semiconductors III
Kong-Thon F. Tsen, Editor(s)

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