Share Email Print
cover

Proceedings Paper

Damage mechanisms for KTiOPO4 crystals under irradiation of a cw argon laser
Author(s): Xiaodong Mu; Yujie J. Ding; Jiyang Wang; Yaogang Liu; Jingqian Wei; Jacob B. Khurgin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have developed a simple method for measuring damage threshold of KTP crystal for CW irradiation using an Argon laser. The experimental results show that there are two types of optical damage in KTP crystal depending on the polarization of the incident laser beam. One type of optical damage corresponds to gray tracks that will be formed when the polarization is perpendicular to the z-axis. Another one is invisible damage that will be formed when the polarization is parallel to the z-axis. In addition, we also observed photorefractive two-wave mixing in KTP crystal under each of the above two polarization states. Our experimental results imply that there exists charge drift during the process of optical damage at both of these polarization states, but the mechanisms are different at these two orthogonal polarization states. After analyses, we believe the first type of damage is due to the formation of Ti3+ centers and the second one is due to the drift of K+ ions.

Paper Details

Date Published: 26 May 1999
PDF: 6 pages
Proc. SPIE 3610, Laser Material Crystal Growth and Nonlinear Materials and Devices, (26 May 1999); doi: 10.1117/12.349238
Show Author Affiliations
Xiaodong Mu, Bowling Green State Univ. (United States)
Yujie J. Ding, Bowling Green State Univ. (United States)
Jiyang Wang, Shandong Univ. (China)
Yaogang Liu, Shandong Univ. (China)
Jingqian Wei, Shandong Univ. (China)
Jacob B. Khurgin, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 3610:
Laser Material Crystal Growth and Nonlinear Materials and Devices
Kathleen I. Schaffers; Lawrence E. Myers, Editor(s)

© SPIE. Terms of Use
Back to Top