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Proceedings Paper

Measurement of aberration by moire pattern
Author(s): Rang-Seng Chang; Chun-Chi Lee
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Paper Abstract

By different moire pattern with computer pattern recognition to test the lens aberration give us the real time on line test the quantity of lens aberrations. I.

Paper Details

Date Published: 1 July 1990
PDF: 1 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34907
Show Author Affiliations
Rang-Seng Chang, National Central Univ. (Taiwan)
Chun-Chi Lee, National Central Univ. (Taiwan)

Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems
F. Lanzl; H.-J. Preuss; G. Weigelt, Editor(s)

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