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Proceedings Paper

Measurement of aberration by moire pattern
Author(s): Rang-Seng Chang; Chun-Chi Lee
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Paper Details

Date Published: 1 July 1990
PDF: 1 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34907
Show Author Affiliations
Rang-Seng Chang, National Central Univ. (Taiwan)
Chun-Chi Lee, National Central Univ. (Taiwan)


Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems

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