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Proceedings Paper

Measurement of coating thickness by two-wavelength phase-shift method
Author(s): Yueguang Lu; Zhaoyue Pei; Xia Zhao; Lingzhen Jiang; Jing Hong
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Paper Abstract

The principLe of twowavelength phaseshift interferometry was described. Appling this method to the measurement of coating thickness of dichromated gelatin satisfied resuLts was obtained.

Paper Details

Date Published: 1 July 1990
PDF: 1 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34873
Show Author Affiliations
Yueguang Lu, Harbin Institute of Technology (China)
Zhaoyue Pei, Harbin Institute of Technology (China)
Xia Zhao, Harbin Institute of Technology (China)
Lingzhen Jiang, Harbin Institute of Technology (China)
Jing Hong, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems
F. Lanzl; H.-J. Preuss; G. Weigelt, Editor(s)

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