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Proceedings Paper

Surface roughness measurement by speckle processing
Author(s): Nelida A. Russo; Nestor A. Bolognini; Enrique E. Sicre; Mario Garavaglia
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Paper Abstract

An optical method is proposed for real-time measuring of statistical parameters asso ciated with diffuser surfaces, such as the rms-roughness value Rq, in the range 1-30 im.

Paper Details

Date Published: 1 July 1990
PDF: 1 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34862
Show Author Affiliations
Nelida A. Russo, CIOP - Centro Inv. (Argentina)
Nestor A. Bolognini, CIOP - Centro Inv. (Argentina)
Enrique E. Sicre, CIOP - Centro Inv. (Argentina)
Mario Garavaglia, Centro de Investigaciones Opti (Argentina)


Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems

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