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Proceedings Paper

500-Mb/s 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry
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Paper Abstract

This paper describes the design, electrical nd optical test results for a 500Mb/s, 32-channel VCSEL driver ICs with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Consortium for Optical and Optoelectronic Technologies in Computing and the Optoelectronics Industry Association. This device is specifically targeted at users building VCSEL-based smart photonic system demonstrators.

Paper Details

Date Published: 30 April 1999
PDF: 9 pages
Proc. SPIE 3631, Optoelectronic Integrated Circuits and Packaging III, (30 April 1999); doi: 10.1117/12.348320
Show Author Affiliations
Fouad E. Kiamilev, Univ. of North Carolina/Charlotte (United States)
Ashok V. Krishnamoorthy, Lucent Technologies/Bell Labs. (United States)


Published in SPIE Proceedings Vol. 3631:
Optoelectronic Integrated Circuits and Packaging III
Michael R. Feldman; Michael R. Feldman; James G. Grote; Mary K. Hibbs-Brenner, Editor(s)

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