Share Email Print
cover

Proceedings Paper

Scanning near-field microscopies
Author(s): Dieter W. Pohl; James K. Gimzewski
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Optical images whose resolution is not limited by diffraction can be created by recording the radiation from a point-like (subwavelength size) probe light source while raster scanning it across an object in immediate proximity. An imaging capability with resolution in the range from 1 to 50 nm has been demonstrated with various types of light sources including luminescence from an STM junction in transmission as well as in reflection emission and in a topographic mode. This paper gives a brief overview of the underlying principles followed by a discussion of a few selected results.

Paper Details

Date Published: 1 July 1990
PDF: 5 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34815
Show Author Affiliations
Dieter W. Pohl, IBM Research Div. (Switzerland)
James K. Gimzewski, IBM Research Div. (Switzerland)


Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems

© SPIE. Terms of Use
Back to Top