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Proceedings Paper

Near-field microscopy of second harmonic generation
Author(s): Igor I. Smolyaninov; Chi Hsiang Lee; Christopher C. Davis
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Paper Abstract

Near-field scanning optical microscopy (NSOM) allows simultaneous mapping of both the topography and optical properties of a surface with resolution below the diffraction limit. Second harmonic generation (SHG) always occurs at a surface, even for centro-symmetric media, because of symmetry breaking. By combining NSOM and SHG we can study local variations in symmetry breaking, caused for example by ferroelectric and ferromagnetic domains, and can correlate them with surface topography. We report NSOM/SHG measurements made on piezoelectric ceramics, ferromagnetic materials and periodic structures.

Paper Details

Date Published: 28 April 1999
PDF: 4 pages
Proc. SPIE 3666, International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '98, (28 April 1999); doi: 10.1117/12.347987
Show Author Affiliations
Igor I. Smolyaninov, Univ. of Maryland/College Park (United States)
Chi Hsiang Lee, Univ. of Maryland/College Park (United States)
Christopher C. Davis, Univ. of Maryland/College Park (United States)


Published in SPIE Proceedings Vol. 3666:
International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '98
Anurag Sharma; Banshi Dhar Gupta; Ajoy K. Ghatak, Editor(s)

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