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Proceedings Paper

Scanning near-field optical microscope with a superfluorescent source
Author(s): Guoping Zhang; Hai Ming; Jiangping Xie
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Paper Abstract

A superfluorescent source used for scanning near-field optical microscope (SNOM) has been developed in this paper. The superfluorescent source originates from an amplified spontaneous emission (ASE) produced by an Er-doped fiber, with a relatively wide spectrum from 1531 nm to 1537 nm. This kind of superfluorescent fiber probe has relatively high photon flux over an ordinary probe. Different image qualities are obtained by the SNOM system with the superfluorescent source and the laser source respectively. Experimental result shows that the coherent noise of the SNOM image is dramatically reduced with the superfluorescent source.

Paper Details

Date Published: 7 May 1999
PDF: 4 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347830
Show Author Affiliations
Guoping Zhang, Central China Normal Univ. (China)
Hai Ming, Univ. of Science and Technology of China (China)
Jiangping Xie, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
Ichirou Yamaguchi, Editor(s)

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