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Proceedings Paper

Direct measurement of evanescent-wave interference patterns with laser-trapped dielectric and metallic particles
Author(s): Min Gu; Pu Chun Ke
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Paper Abstract

Interference patterns of evanescent waves have been recorded with laser-trapped dielectric and metallic particles. It has been demonstrated that the image contrast can be improved with laser-trapped metallic particles. Compared with other methods such as scanning tunnelling optical microscopy and shear-force optical microscopy, imaging with a laser-trapped particle is a simpler approach as no distance control is required. On the other hand, the pseudo effect introduced by the distance between a near-field probe and a sample may be reduced as a particle is trapped on the surface of a sample.

Paper Details

Date Published: 7 May 1999
PDF: 4 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347826
Show Author Affiliations
Min Gu, Victoria Univ. of Technology (Australia)
Pu Chun Ke, Victoria Univ. of Technology (Australia)


Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)

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