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Proceedings Paper

Novel nonoptical method of tip-sample distance regulation based on shear force in scanning near-field optical microscopy
Author(s): Xiumei Liu; Jia Wang; Dacheng Li
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Paper Abstract

In this paper a novel method for tip-sample distance regulation based on shear-force is presented. A semicircular piezo-electric ceramic plate is used as the excitation as well as detection element, the electrode of which is divided into three segments. The first segment is excited by a generator and the second one is used to fix the fiber tip. The induced voltage on the third segment is used to detect the tip-sample distance. The approach curves show that it is very sensitive and the tip-sample distance can be regulated below 5 nm. Experimental results indicate that when the sample is covered with liquid the approach curve is different from that in the air. In addition, during experiments we found that at some resonant frequency the approach curve is different from the conventional shape. The phenomenon, if proved reliable, can be used to realize automatic and rapid tip-sample approach as well as small-scale distance regulation.

Paper Details

Date Published: 7 May 1999
PDF: 3 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347824
Show Author Affiliations
Xiumei Liu, Tsinghua Univ. (China)
Jia Wang, Tsinghua Univ. (China)
Dacheng Li, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
Ichirou Yamaguchi, Editor(s)

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