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Proceedings Paper

Improved phase unwrapping of a phase-shift interferometer using a precision XY-scanner
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Paper Abstract

A phase shift interferometer with an improved phase unwrapping is presented. The nanometer resolution XY stage is integrated into the standard temporal phase shifting interferometer. The nanometer resolution XY stage is used to position specimen in subpixel of CCD detector, therefore CCD detector's sampling frequency is made high. This paper presents spatial sampling of CCD and two scanning algorithms, whose simulation and experiment results are also presented. The results show that the scanning algorithms make CCD detector's sampling frequency high, and phase unwrapping is improved also.

Paper Details

Date Published: 7 May 1999
PDF: 4 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347772
Show Author Affiliations
Sunglim Park, Korea Advanced Institute of Science and Technology (South Korea)
Dae gab Gweon, Korea Advanced Institute of Science and Technology (South Korea)
Kee S. Moon, Michigan Technological Univ. (United States)


Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
Ichirou Yamaguchi, Editor(s)

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