Proceedings Paper
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Paper Abstract
In our paper we have analyzed the application possibility of a modified version of speckle pattern interferometry: the adaptive speckle pattern interferometry (ASPI). The peculiarity of this technique is that reference waves are produced by holographically reconstructed virtual images. Using this course an adaptive measuring system can be built. A realization of the ASPI is presented as a measuring device for various measuring tasks. Selected applications are shown from real time holography to comparative displacement measurement.
Paper Details
Date Published: 7 May 1999
PDF: 4 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347739
Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
Ichirou Yamaguchi, Editor(s)
PDF: 4 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347739
Show Author Affiliations
Janos Kornis, Technical Univ. of Budapest (Hungary)
Zoltan Fuzessy, Technical Univ. of Budapest (Hungary)
Zoltan Fuzessy, Technical Univ. of Budapest (Hungary)
Attila Nemeth, Technical Univ. of Budapest (Hungary)
Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
Ichirou Yamaguchi, Editor(s)
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