Share Email Print

Proceedings Paper

Application of spatial filtering technique to automatic optical card inspection
Author(s): T. Sato; F. Kimura; Shigeru Izawa; S. Takahashi; Kashiko Kodate; Takeshi Kamiya
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

For the total system of optical cards defects on cards deteriorate their performance. We have developed an automatic inspection system of optical cards where we have applied spatial filtering technique to eliminate the periodic background pattern.

Paper Details

Date Published: 1 July 1990
PDF: 2 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34773
Show Author Affiliations
T. Sato, CSK Corp. (Japan)
F. Kimura, CSK Corp. (Japan)
Shigeru Izawa, CSK Corp. (Japan)
S. Takahashi, CSK Corp. (Japan)
Kashiko Kodate, Japan Women's Univ. (Japan)
Takeshi Kamiya, Univ. of Tokyo (Japan)

Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems
F. Lanzl; H.-J. Preuss; G. Weigelt, Editor(s)

© SPIE. Terms of Use
Back to Top