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Proceedings Paper

Confocal photoluminescense microscopy in II-VI materials: annealing and degradation dynamics
Author(s): Eithne M. McCabe; Christopher Jordan; D. T. Fewer; John F. Donegan; S. Taniguchi; T. Hino; Kazushi Nakano; Akira Ishibashi; Petteri Uusimaa; Markus Pessa
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Paper Abstract

Confocal photoluminescence imaging is an important tool in the investigation of recombination in semiconductors and in the characterization of material growth. This characterization is particularly important for II-VI wide band-gap semiconductors where the potential for blue-green lasers is being explored currently. To achieve room-temperature cw operation of these lasers over the multi-thousand hours necessary for commercialization, extremely low defect densities are required. The confocal microscope is used in this work to image photoluminescence from II-VI materials to characterize the defect formation and propagation within the quantum well region of the material. This imaging approach permits the degradation to be monitored in real time and over a large area in samples with low defect densities. The additional advantages of this set-up over a conventional microscope are, of course, the higher lateral resolution and narrow depth of field associated with a confocal microscope. While considerable effort has been focused on the degradation in these II-VI semiconductors, we have recently observed that annealing can occur simultaneously in the same sample when the material is exposed to intense optical excitation. Images of annealing and degradation of a range of II-VI samples will be presented to highlight these observations.

Paper Details

Date Published: 6 May 1999
PDF: 8 pages
Proc. SPIE 3605, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI, (6 May 1999); doi: 10.1117/12.347591
Show Author Affiliations
Eithne M. McCabe, Trinity College Dublin (Ireland)
Christopher Jordan, Trinity College Dublin (Ireland)
D. T. Fewer, Trinity College Dublin (Ireland)
John F. Donegan, Trinity College Dublin (Ireland)
S. Taniguchi, Sony Research Ctr. (Japan)
T. Hino, Sony Research Ctr. (Japan)
Kazushi Nakano, Sony Research Ctr. (Japan)
Akira Ishibashi, Sony Research Ctr. (Japan)
Petteri Uusimaa, Tampere Univ. of Technology (Finland)
Markus Pessa, Tampere Univ. of Technology (Finland)


Published in SPIE Proceedings Vol. 3605:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI
Dario Cabib; Carol J. Cogswell; Jose-Angel Conchello; Jeremy M. Lerner; Tony Wilson, Editor(s)

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