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Proceedings Paper

Segmentation for the optical micrograph of fungi by using spectral transmittance and neural network
Author(s): Masaru Takeya; Norimichi Tsumura; Hideaki Haneishi; Yoichi Miyake
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Paper Abstract

Transmittance spectra of optical micrograph of fungi were estimated from seven band images based on the Wiener estimation method. The optical microscope adjusted with monochrome digital camera (Kodak DCS420m, 1536 X 1024 pixels) with seven band filters was used for image acquisition. Transmittance spectra of 16 color transparencies were measured by spectral photometer in advance, and the seven band images of color transparency were taken by microscopic imaging system. A matrix for Wiener estimation was calculated using these measured transmittance spectra and camera responses. As the result of Wiener estimation, normalized root mean square error (NRMSE) between the original and estimated transmittance spectra of 16 color transparencies was 0.035. Wiener estimation method was applied to estimate the spectral transmittance of five species which belong to one genus of fungi. Transmittance spectra of fungi were calculated from camera responses in each pixel and the above estimation matrix. The estimated transmittance spectra were used for segmentation of conidia and hyphae in fungal microscopic image to identify them. Competitive learning in neural network was applied to the segmentation from spectral microscopic image. It was found that segmentation based on spectral transmittance was more accurate than the segmentation based on RGB values.

Paper Details

Date Published: 6 May 1999
PDF: 9 pages
Proc. SPIE 3605, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI, (6 May 1999); doi: 10.1117/12.347575
Show Author Affiliations
Masaru Takeya, Chiba Univ. and National Institute of Agrobiological Resources (Japan)
Norimichi Tsumura, Chiba Univ. (Japan)
Hideaki Haneishi, Chiba Univ. (Japan)
Yoichi Miyake, Chiba Univ. (Japan)


Published in SPIE Proceedings Vol. 3605:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI
Dario Cabib; Carol J. Cogswell; Jose-Angel Conchello; Jeremy M. Lerner; Tony Wilson, Editor(s)

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