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Proceedings Paper

Nondestructive laser system for the in-situ study of the kinetics of the adsorption processes at solid/liquid interface
Author(s): Radu Todoran; Josif P. Sharkany
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Paper Abstract

This paper presents a laser-optical fiber system which allows us to estimate continuously and 'in situ' the evolution of the adsorption layer at the interface solid-liquid. Locally, the kinetics of the evolution of the adsorption layer at the interface between a mineral and a xanthate organic solution, is investigated. In this case, the knowledge for the kinetics of the adsorption process is extremely important for explaining the intimate mechanisms of the flotation industrial processes. The monitoring system for the kinetics of the adsorption of xanthate organic molecules on the mineral support is based, during its run, on the variation in the relative reflectance of the interface due to the adsorption layer evolution. The method, designed to study the evolution kinetics of the adsorption layer at the interface between a xanthate solution and a sulphuric mineral, is based on the proportionally link between the evolution of the adsorption layer and the relative variation of its refraction index. The experimental appliance used a coherent and monochromatic unpolarized laser radiation, with its wavelength (lambda) equals 0.89 micrometer, which corresponds to the near IR range. This wavelength has been chosen both for physical performed using an Al mirror as standard for maximum (100%) reflectance, and by immersing it into different xanthate solutions having successively the following concentrations: 25 mg/l; 50 mg/l; 100 mg/l and 3 g/l, respectively. This procedure allowed to observe that the reflection given by the mirror, in these cases, has a relatively narrow spectral range in UV, for which it has values greater for 4 - 6%. The following ones have been used: isobutyl xanthate, amyl xanthate and ethyl xanthate. The reflection spectrum on the mirror (if neglecting the attenuation in liquid and the transmission spectrum) was measured by means of a spectrophotometer SPECORD M40 (made in Germany), and the determinations were performed in the range from 200 to 950 nm.

Paper Details

Date Published: 5 May 1999
PDF: 3 pages
Proc. SPIE 3687, International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (5 May 1999); doi: 10.1117/12.347436
Show Author Affiliations
Radu Todoran, North Univ. of Baia Mare (Romania)
Josif P. Sharkany, Uzhgorod State Univ. (Ukraine)


Published in SPIE Proceedings Vol. 3687:
International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

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