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Proceedings Paper

Birefringence dispersion inhomogeneity testing in optical materials by imaging polarimetry
Author(s): Andrzej L. Bajor
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Paper Abstract

In many optical applications of anisotropic crystals birefringence dispersion (BD) is at least so important as birefringence spatial inhomogeneity itself. In this work a new technique of 2D mapping of parameters related to BD in plane-parallel wafers of optical materials is reported. A computer-controlled imaging spectro-polarimeter is used for recording the wafers' images for consecutively varying wavelengths. Examples of practical measurements carried out on undoped and Cu-doped LiNbO3 are presented.

Paper Details

Date Published: 29 April 1999
PDF: 5 pages
Proc. SPIE 3729, Selected Papers from International Conference on Optics and Optoelectronics '98, (29 April 1999); doi: 10.1117/12.346830
Show Author Affiliations
Andrzej L. Bajor, Institute of Electronic Materials Technology (Poland)


Published in SPIE Proceedings Vol. 3729:
Selected Papers from International Conference on Optics and Optoelectronics '98
Kehar Singh; Om Prakash Nijhawan; Arun Kumar Gupta; A. K. Musla, Editor(s)

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