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Proceedings Paper

Moire interferometric strain sensor
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Paper Abstract

A new compact system is proposed and instrumentated for directly measuring in-plane strain using a high frequency grating and two Position Sensor Detectors (PSDs). The grating with a frequency of 1200 lines/mm attached on the surface of a specimen is illuminated by a focused laser beam. The spatial resolution for strain measurement, i.e. illuminating area on the specimen is about 0.4 mm. The centroids of diffracted beam spots from the grating is automatically determined with two PSD sensors connected to a personal computer. The shift of diffracted beam spots due to the specimen deformation is then detected. Several measures for improving strain sensitivity are taken. Strain sensitivity of 1 micro-strain can be obtained. The residual strain error is analyzed due to the misalignment of laser and grating. The system can be used for both static and dynamic test.

Paper Details

Date Published: 29 April 1999
PDF: 5 pages
Proc. SPIE 3729, Selected Papers from International Conference on Optics and Optoelectronics '98, (29 April 1999); doi: 10.1117/12.346814
Show Author Affiliations
Anand Krishna Asundi, Nanyang Technological Univ. (Singapore)
Bing Zhao, Ecole des Mines de Saint-Etienne (United States)

Published in SPIE Proceedings Vol. 3729:
Selected Papers from International Conference on Optics and Optoelectronics '98
Kehar Singh; Om Prakash Nijhawan; Arun Kumar Gupta; A. K. Musla, Editor(s)

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