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Proceedings Paper

Shearing interferometry
Author(s): Kiyofumi Matsuda
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Paper Abstract

Applications of ordinary two-beam shearing interferometry to (1) aberration measurements of an optical system, (2) aberration correction of an optical system, and of Multiple Beam Shearing Interferometry (MBSI), (3) beam collimation, (4) focal length measurements, and (5) a position magnifying sensor, are described. For two-beam shearing interferometry, a holographic shearing interferometer with two separated three-beam holograms, is used. For MBSI, a shear plate with two flat surfaces of glass, wedged at a small angle and coated to obtain high reflectivity, is used. Theoretical and experimental results are presented for both situations.

Paper Details

Date Published: 29 April 1999
PDF: 9 pages
Proc. SPIE 3729, Selected Papers from International Conference on Optics and Optoelectronics '98, (29 April 1999); doi: 10.1117/12.346805
Show Author Affiliations
Kiyofumi Matsuda, Univ. of Sydney (Australia)


Published in SPIE Proceedings Vol. 3729:
Selected Papers from International Conference on Optics and Optoelectronics '98
Kehar Singh; Om Prakash Nijhawan; Arun Kumar Gupta; A. K. Musla, Editor(s)

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