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Proceedings Paper

Optical coverings in modulators and deflectors in far-IR range
Author(s): Iosif N. Sisakian; Alexander V. Tikhonravov; Alexander V. Shvartsburg; Andrew V. Shepelev
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Paper Abstract

In far IR range the reflection and transparency characteristics o semiconductors are determined. by tree carriers plasma, its dielectric permittivity being determined. by pulse relaxation time c. The parameter depends on external electromagnetic flelcls,that allows to control the reflection radiation parameters. It's important,that this method permits one to obtain high mod.ulat ion frequency ( 1 Hz ). Optical coating of semiconductor surface allows to extend essentially the possibilities of such control, e.g. to increase the modulation depth. In this paper conditions o1 the absence o reflection 1or the given T are derived.

Paper Details

Date Published: 1 August 1990
PDF: 7 pages
Proc. SPIE 1274, Electro-Optic and Magneto-Optic Materials II, (1 August 1990); doi: 10.1117/12.34680
Show Author Affiliations
Iosif N. Sisakian, Central Design Bureau for Uniq (Russia)
Alexander V. Tikhonravov, Moscow Univ. (Russia)
Alexander V. Shvartsburg, Central Design Bureau for Unique Instrumentation (Russia)
Andrew V. Shepelev, Central Design Bureau for Unique Instrumentation (Russia)

Published in SPIE Proceedings Vol. 1274:
Electro-Optic and Magneto-Optic Materials II
Hans Dammann, Editor(s)

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