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Proceedings Paper

Fringe locking in a laser diode interferometer in the presence of current modulation
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Paper Abstract

A fringe locking phenomenon in a two beam interferometer using a semiconductor laser subject to optical feedback has been observed, whose injection current is modulated. When a path difference of the interferometer is sufficient, fringes taken by a CCD camera are seen to be stationary and the rms fluctuations of fringe phase is reduced to as low as 0.2 (pi) radians from more than 9 (pi) radians that is observed without the optical feedback. The rms phase fluctuation is independent of frequency and amplitude of the current modulation. The fringe locking has also been observed in the presence of both injection current modulation and PZT mirror vibration of the interferometer. A theoretical analysis has been performed that explains the observed phenomenon. It has been shown that the wavelength change due to injection current is controlled by the interferometer. The dependence of wavelength change on the injection current variation is calculated using a model of coupled resonators consisting of the laser cavity and the interferometer. The fringe phase change caused by modulation of injection current is derived from it. The calculated phase fluctuation agrees well with those observed in experiments.

Paper Details

Date Published: 14 April 1999
PDF: 10 pages
Proc. SPIE 3626, Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV, (14 April 1999); doi: 10.1117/12.345437
Show Author Affiliations
Jiyuan Liu, RIKEN--The Institute of Physical and Chemical Research (United States)
Ichirou Yamaguchi, RIKEN--The Institute of Physical and Chemical Research (Japan)


Published in SPIE Proceedings Vol. 3626:
Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV
Mahmoud Fallahi; Kurt J. Linden; S. C. Wang; S. C. Wang; Mahmoud Fallahi, Editor(s)

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