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Proceedings Paper

Reliability and degradation mechanisms of high-power diode lasers
Author(s): Juergen Jandeleit; Nicolas Wiedmann; Peter Loosen; Reinhart Poprawe
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Paper Abstract

The degradation of GaAlAs/GaAs laser diode bars mounted on copper micro channel heat sinks was investigated using optical microscopy, scanning electron microscopy and EDX- spectroscopy. The high power diode lasers were characterized before and after burn-in and after long term lifetests. Changes in surface morphology and surface composition of the facets were detected as well as changes in threshold current, slope efficiency and wavelength. Due to the degradation threshold current increases and slope efficiency decreases while the wavelengths were shifted to higher values showing a broader spectral width. The influence of these changes on performance and lifetime of the high power diode lasers will be discussed.

Paper Details

Date Published: 14 April 1999
PDF: 5 pages
Proc. SPIE 3626, Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV, (14 April 1999); doi: 10.1117/12.345432
Show Author Affiliations
Juergen Jandeleit, Fraunhofer Institute for Laser Technology (United States)
Nicolas Wiedmann, Fraunhofer Institute for Laser Technology (Germany)
Peter Loosen, Fraunhofer Institute for Laser Technology (Germany)
Reinhart Poprawe, Fraunhofer Institute for Laser Technology (Germany)


Published in SPIE Proceedings Vol. 3626:
Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV
Mahmoud Fallahi; S. C. Wang; Mahmoud Fallahi; Kurt J. Linden; S. C. Wang, Editor(s)

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