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Proceedings Paper

Alignment-tolerant structures for ease of optoelectronic packaging
Author(s): Mario Dagenais; Simarjeet S. Saini; Vijayanand Vusirikala; Robert E. Bartolo; Ralph D. Whaley; Z. Dilli; Y. Hu; Zhencan Frank Fan; F. G. Johnson; Paul H. Shen; Jagadeesh Pamulapati; Weimin Zhou; Dennis Stone
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Paper Abstract

Expanded mode alignment tolerant optical structures will play an important role in low-cost, large-scale packaging of optoelectronic devices. In this paper, we present two expanded mode structures for operation at 1.55 micrometers . Our devices use single epitaxial growth and conventional fabrication schemes. High butt-coupling efficiencies (> 40%) to a single mode fiber with relaxed alignment tolerances were achieved. The first of our devices uses adiabatic transformation over 500 micrometers . The second device uses resonant coupling over a much shorter region of 200 micrometers . The second scheme offers an interesting possibility for monolithic integration of active-passive components. We present the design and simulation results of such an integrated device.

Paper Details

Date Published: 14 April 1999
PDF: 10 pages
Proc. SPIE 3626, Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV, (14 April 1999); doi: 10.1117/12.345423
Show Author Affiliations
Mario Dagenais, Univ. of Maryland/College Park (United States)
Simarjeet S. Saini, Univ. of Maryland/College Park (United States)
Vijayanand Vusirikala, Univ. of Maryland/College Park (United States)
Robert E. Bartolo, Univ. of Maryland/College Park (United States)
Ralph D. Whaley, Univ. of Maryland/College Park (United States)
Z. Dilli, Univ. of Maryland/College Park (United States)
Y. Hu, Univ. of Maryland/College Park (United States)
Zhencan Frank Fan, Univ. of Maryland/College Park (United States)
F. G. Johnson, Lab. for Physical Sciences (United States)
Paul H. Shen, U.S. Army Research Lab. (United States)
Jagadeesh Pamulapati, U.S. Army Research Lab. (United States)
Weimin Zhou, U.S. Army Research Lab. (United States)
Dennis Stone, Lab. for Physical Sciences (United States)


Published in SPIE Proceedings Vol. 3626:
Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV
Mahmoud Fallahi; S. C. Wang; Mahmoud Fallahi; Kurt J. Linden; S. C. Wang, Editor(s)

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