Share Email Print
cover

Proceedings Paper

Effect of laser irradiation on (Cd,Hg)Te properties
Author(s): Apollinariy Zaginey; Bohdan K. Kotlyarchuk; Volodymyr G. Savitsky; V. Pisarevsky
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Experimental investigations of (Cd,Hg)Te have been performed with the use of ns- and ms-duration pulses of solid state laser. Changes in the chemical composition of the irradiated surface have been analyzed by means of X-ray photoelectron and Auger electron spectroscopies. Single crystalline HgTe and (Cd,Hg)Te wafers and epitaxial films have been used as the experimental samples. Processes of integral evaporation with generation of a molten zone with thickness up to several micrometers dominate upon ns-pulses irradiation and crystallization follows autoepitaxy laws. There was not observed increase of linear defects density in the layer near surface. Inverse layer depth in n-(Cd,Hg)Te coincides with molten zone. In the case of ms-pulses the influenced zone is several tenth micrometers thick. Irradiation of the samples at T equals 500 - 600 K in saturated Hg vapor completely suppresses the change of the surface composition. Heating of (Cd,Hg)Te sample leads to generation of a great number of acceptor-type native defects. As a results p-n junctions are formed in n-(Cd,Hg)Te by pulsed laser irradiation.

Paper Details

Date Published: 8 April 1999
PDF: 4 pages
Proc. SPIE 3725, International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (8 April 1999); doi: 10.1117/12.344753
Show Author Affiliations
Apollinariy Zaginey, Institute of Applied Problems of Mechanics and Mathematics (Ukraine)
Bohdan K. Kotlyarchuk, Institute of Applied Problems of Mechanics and Mathematics (Ukraine)
Volodymyr G. Savitsky, Ivan Franko State Univ. of Lviv (Ukraine)
V. Pisarevsky, Ivan Franko State Univ. of Lviv (Ukraine)


Published in SPIE Proceedings Vol. 3725:
International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology
Antoni Rogalski; Jaroslaw Rutkowski, Editor(s)

© SPIE. Terms of Use
Back to Top