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Proceedings Paper

Point contact spectroscopy of ZnS:Mn,Cu-Al thin film cells
Author(s): Bronislaw Susla; Eugeniusz Chimczak; Miroslawa Bertrandt-Zytkowiak; Maciej Kaminski
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Paper Abstract

A point contact ZnS:Mn,Cu thin film-normal metal (Pt0.9Ir0.1 junctions were investigated. The current and differential resistance versus dc applied voltage were measured. We observed, the dependencies exhibit memory effect. It was found that the effect strongly depends on temperature. It is shown that Pool-Frenkel mechanism of the charge transport describes well the measured I(U) characteristics.

Paper Details

Date Published: 8 April 1999
PDF: 5 pages
Proc. SPIE 3725, International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (8 April 1999); doi: 10.1117/12.344741
Show Author Affiliations
Bronislaw Susla, Poznan Univ. of Technology (Poland)
Eugeniusz Chimczak, Poznan Univ. of Technology (Poland)
Miroslawa Bertrandt-Zytkowiak, Poznan Univ. of Technology (Poland)
Maciej Kaminski, Poznan Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 3725:
International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology

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