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Proceedings Paper

Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs
Author(s): Steven L. Wright; Steven Millman; Manabu Kodate
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Paper Abstract

Capacitance crosstalk and TFT photoleakage affect the transmission-voltage array characteristics in high- resolution TFTLCDs. These effects depend upon the drive inversion scheme use, and are image-dependent. Photoleakage can also be a cause of flicker in TFTLCDs at low frame rates. One characterization method utilizes comparison of front-of-screen measurements with either measured test cells or theoretical cell characteristics. A second method utilizes digital crosstalk compensation, in which the image data provided to the panel is modified to offset the effects of crosstalk in various test image patterns.

Paper Details

Date Published: 12 April 1999
PDF: 12 pages
Proc. SPIE 3636, Flat Panel Display Technology and Display Metrology, (12 April 1999); doi: 10.1117/12.344647
Show Author Affiliations
Steven L. Wright, IBM Thomas J. Watson Research Ctr. (United States)
Steven Millman, IBM Thomas J. Watson Research Ctr. (United States)
Manabu Kodate, IBM Yamato Lab. (Japan)


Published in SPIE Proceedings Vol. 3636:
Flat Panel Display Technology and Display Metrology
Bruce Gnade; Edward F. Kelley, Editor(s)

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