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Proceedings Paper

New uniformity measurement method for LCD panels
Author(s): Thierry R. Leroux
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Paper Abstract

A new uniformity measurement method and the associated equipment is described. This method avoids the viewing angle dependence of the uniformity measurement results, which is observed with conventional area photometer methods. After describing and analyzing currently used techniques and their merits and drawbacks, the modified method is introduced and evaluated. Results of measurements carried out on a conventional TFT LCDs are analyzed.

Paper Details

Date Published: 12 April 1999
PDF: 8 pages
Proc. SPIE 3636, Flat Panel Display Technology and Display Metrology, (12 April 1999); doi: 10.1117/12.344646
Show Author Affiliations
Thierry R. Leroux, Eldim (France)


Published in SPIE Proceedings Vol. 3636:
Flat Panel Display Technology and Display Metrology
Bruce Gnade; Edward F. Kelley, Editor(s)

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