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Proceedings Paper

Materials-theory-based device modeling for III-nitride devices
Author(s): P. Paul Ruden
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Paper Abstract

The III-nitride materials are recognized as very promising candidates for the fabrication of optoelectronic devices for the visible and ultraviolet spectral ranges as well as for high-frequency electronic devices operating at high power levels and in caustic environments. At present, device quality materials preparation is making rapid progress and some devices have been successfully demonstrated and even commercialized. However, much of the basic materials, characterization data that is readily available in more conventional technologies is still lacking for the III-nitride materials. In this paper, a materials-theory-based device modeling methodology that is suitable for this unique situation of accelerated device exploration is discussed. EXamples of ultraviolet photodetectors in which the materials- theory-based device modeling technique has been used for device design and data analysis are presented.

Paper Details

Date Published: 7 April 1999
PDF: 10 pages
Proc. SPIE 3629, Photodetectors: Materials and Devices IV, (7 April 1999); doi: 10.1117/12.344555
Show Author Affiliations
P. Paul Ruden, Univ. of Minnesota/Twin Cities (United States)


Published in SPIE Proceedings Vol. 3629:
Photodetectors: Materials and Devices IV
Gail J. Brown; Manijeh Razeghi, Editor(s)

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