Share Email Print
cover

Proceedings Paper

Size dependence of record-efficiency non-resonant cavity light-emitting diodes
Author(s): Reiner Windisch; Paul L. Heremans; Barundeb Dutta; Stefan Nemeth; Alexander Knobloch; Gottfried H. Doehler; Gustaaf Borghs
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Non-resonant cavity light-emitting diodes (NRC-LED's) are based on the combination of surface texturing and the application of a back mirror. With this concept, the extraction efficiency of LED's can be enhanced considerably. We fabricated NRC-LED's with a more sophisticated design employing an oxidized current aperture, which is similar to the commonly used for vertical-cavity surface-emitting lasers. In our NRC-LED's, it confines the injection current to the center of the device in order to reduce light generation below the top contact. We analyze the impact of the aperture size on the device performance, and we show that both the maximum efficiency and the injection current where it is reached are strongly dependent on the device size. Its correlation with the temperature in the active region and the current density is discussed. In addition, we demonstrate that a considerably fraction of the light can be extracted from lateral guided modes in the LED structure by extending the surface texturing beyond the device mesa. Devices fabricated by applying all of the above techniques result in record external quantum efficiencies of 31%.

Paper Details

Date Published: 14 April 1999
PDF: 8 pages
Proc. SPIE 3621, Light-Emitting Diodes: Research, Manufacturing, and Applications III, (14 April 1999); doi: 10.1117/12.344480
Show Author Affiliations
Reiner Windisch, IMEC (Germany)
Paul L. Heremans, IMEC (Belgium)
Barundeb Dutta, IMEC (Belgium)
Stefan Nemeth, IMEC (Belgium)
Alexander Knobloch, Univ. Erlangen-Nuernberg (Germany)
Gottfried H. Doehler, Univ. Erlangen-Nuernberg (Germany)
Gustaaf Borghs, IMEC (Belgium)


Published in SPIE Proceedings Vol. 3621:
Light-Emitting Diodes: Research, Manufacturing, and Applications III
E. Fred Schubert; Ian T. Ferguson; H. Walter Yao, Editor(s)

© SPIE. Terms of Use
Back to Top