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Proceedings Paper

Configuration optimization and sensitivity comparison among thermal lens, photothermal deflection, and interference detection techniques
Author(s): Bincheng Li; Eberhard Welsch
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Paper Abstract

Photothermal techniques, such as probe beam deflection and thermal lens detection, have been widely used for low absorption measurement, thermal characterization, and laser- induced damage detection of optical coatings. In specially configured photothermal techniques, the probe beam either detects the photothermally induced refractive index change inside the sample via propagation through the interacting region in the measured sample, or detects the surface displacement via reflection from the deformed surface. Usually, due to the very low absorption of the sample or/and the short interaction length, a very high sensitivity is required for such applications. It is therefore of importance to maximize the sensitivity for each measurement, by selecting appropriate detection scheme and optimizing the performance of the selected scheme. In this paper, we first maximize the sensitivity of these photothermal techniques by configuration optimization, then compare their maximum sensitivity. The applicability of the pulsed photothermal techniques to optical coating characterization is also discussed.

Paper Details

Date Published: 7 April 1999
PDF: 10 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344458
Show Author Affiliations
Bincheng Li, Friedrich-Schiller-Univ. Jena (Germany)
Eberhard Welsch, Friedrich-Schiller-Univ. Jena (Germany)


Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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