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Proceedings Paper

Automated damage test facilities for materials development and production optic quality assurance at Lawrence Livermore National Laboratory
Author(s): Lynn Matthew Sheehan; Sheldon Schwartz; Colin L. Battersby; Richard K. Dickson; Richard T. Jennings; James F. Kimmons; Mark R. Kozlowski; Stephen M. Maricle; Ron P. Mouser; Michael J. Runkel; Carolyn L. Weinzapfel
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Paper Abstract

The Laser Program at LLNL has developed automated facilities for damage testing optics up to 1 meter in diameter. The system were developed to characterize the statistical distribution of localized damage performance across large- aperture National Ignition Facility optics. Full aperture testing is a key component of the quality assurance program for several of the optical components. The primary damage testing methods used are R:1 mapping and raster scanning. Automation of these test methods was required to meet the optics manufacturing schedule. The automated activities include control and diagnosis of the damage-test laser beam as well as detection and characterization of damage events.

Paper Details

Date Published: 7 April 1999
PDF: 12 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344447
Show Author Affiliations
Lynn Matthew Sheehan, Lawrence Livermore National Lab. (Ireland)
Sheldon Schwartz, Lawrence Livermore National Lab. (United States)
Colin L. Battersby, Lawrence Livermore National Lab. (United States)
Richard K. Dickson, Lawrence Livermore National Lab. (United States)
Richard T. Jennings, Lawrence Livermore National Lab. (United States)
James F. Kimmons, Lawrence Livermore National Lab. (United States)
Mark R. Kozlowski, Lawrence Livermore National Lab. (United States)
Stephen M. Maricle, Lawrence Livermore National Lab. (United States)
Ron P. Mouser, Lawrence Livermore National Lab. (United States)
Michael J. Runkel, Lawrence Livermore National Lab. (United States)
Carolyn L. Weinzapfel, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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