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Proceedings Paper

Is it opportune to study laser-induced damage of coatings by optical characterization?
Author(s): Emile P. Pelletier; Francois Flory; Josep Massaneda; Pierre J. Roche
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Paper Abstract

High quality thin films completely free of defects is the goal for higher damage threshold but it remains a dream. Specific means of characterization to measure absorption losses by photothermal deflection and scattering losses are currently used. The analysis of experimental results permits to understand how the real behavior of thin films can be affected by localized defects. With the development of the mapping technique, the comparison between absorption and scattering intensity maps of the surface of coatings appears to be a good tool for this study. Moreover we need a more basic information concerning the multilayer under study and characterization by guided wave appears to be really fruitful. It permits the determination of the refractive index and the thickness of the different layers. Additional measurements of attenuation of guided waves can be used for the location of the absorption sites in the depth of the coating.

Paper Details

Date Published: 7 April 1999
PDF: 8 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344431
Show Author Affiliations
Emile P. Pelletier, Ecole Nationale Superieure de Physique (France)
Francois Flory, Ecole Nationale Superieure de Physique (France)
Josep Massaneda, Ecole Nationale Superieure de Physique (France)
Pierre J. Roche, Ecole Nationale Superieure de Physique (France)

Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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