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Proceedings Paper

Characterization of surface and subsurface defects in optical materials using near-field evanescent wave (Abstract Only)
Author(s): Ming Yan; Stan Oberhelman; Wigbert J. Siekhaus; Zhouling Wu; Lynn Matthew Sheehan; Mark R. Kozlowski
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Paper Abstract

Optical properties of sub-micron defects is of interest in many application, including laser induced damage in optical materials. In-situ scanning atomic force microscopy has been used previously to establish a direct correlation between a particular structure surface inhomogeneity and the initiation of local laser damage at that inhomogeneity, as in the case of nodular defects in coatings. Recent development in near field scanning optical microscopy shows that this technique can also provide information on both morphology and optical properties of localized defects.

Paper Details

Date Published: 7 April 1999
PDF: 3 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344425
Show Author Affiliations
Ming Yan, Lawrence Livermore National Lab. (United States)
Stan Oberhelman, Lawrence Livermore National Lab. (United States)
Wigbert J. Siekhaus, Lawrence Livermore National Lab. (United States)
Zhouling Wu, Lawrence Livermore National Lab. (United States)
Lynn Matthew Sheehan, Lawrence Livermore National Lab. (United States)
Mark R. Kozlowski, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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