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Proceedings Paper

Laser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings
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Paper Abstract

Laser modulated scattering (LMS) is introduced as a non- destruction evaluation tool for defect inspection and characterization of optical surface sand thin film coatings. It allows simultaneous measurement of the DC and AC scattering signals of a probe laser beam from an optical surface. by comparison between the DC and AC scattering signals, one can differentiate absorptive defects from non- absorptive ones. This paper describes the principle of the LMS technique and the experimental setup, and illustrates examples on using LMS as a tool for nondestructive evaluation of high quality optics.

Paper Details

Date Published: 7 April 1999
PDF: 9 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344422
Show Author Affiliations
Zhouling Wu, Lawrence Livermore National Lab. (United States)
Michael D. Feit, Lawrence Livermore National Lab. (United States)
Mark R. Kozlowski, Lawrence Livermore National Lab. (United States)
Alexander M. Rubenchik, Lawrence Livermore National Lab. (United States)
Lynn Matthew Sheehan, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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